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HomeProductsCapacitorsAluminum Electrolytic CapacitorsUSL1H0R1MDD
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USL1H0R1MDD - Nichicon

Manufacturer Part Number
USL1H0R1MDD
Manufacturer
Nichicon
Allelco Part Number
98D-USL1H0R1MDD
Warranty
1 Year Allelco Warranty - Find out more
Stock Status:
471,105 pcs available, New & Original
Parts Description
CAP ALUM 0.1UF 20% 50V RADIAL
Package
Radial, Can
Data sheet
USL1H0R1MDD.pdf

HTML Datasheet

SL Series, U Type.pdf

PCN Obsolescence/ EOL

USL Series 05/Apr/2018.pdf
RoHs Status
 
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Specifications

USL1H0R1MDD Tech Specifications
Nichicon - USL1H0R1MDD technical specifications, attributes, parameters and parts with similar specifications to Nichicon - USL1H0R1MDD

Product Attribute Attribute Value
Manufacturer Nichicon
Voltage - Rated 50 V
Tolerance ±20%
Surface Mount Land Size -
Size / Dimension 0.157' Dia (4.00mm)
Series USL
Ripple Current @ Low Frequency 1 mA @ 120 Hz
Ripple Current @ High Frequency 1.5 mA @ 10 kHz
Ratings -
Polarization Polar
Product Attribute Attribute Value
Package / Case Radial, Can
Package Bulk
Operating Temperature -40°C ~ 85°C
Mounting Type Through Hole
Lifetime @ Temp. 1000 Hrs @ 85°C
Lead Spacing 0.059' (1.50mm)
Height - Seated (Max) 0.315' (8.00mm)
ESR (Equivalent Series Resistance) -
Capacitance 0.1 µF
Applications General Purpose

Environmental & Export Classifications

ATTRIBUTE DESCRIPTION
Moisture Sensitivity Level (MSL) Not Applicable
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8532.22.0020

Frequently Asked Questions(FAQ)

What is the expected lifespan of the USL1H0R1MDD capacitor under continuous operation at maximum temperature?
The USL1H0R1MDD is rated for 1000 hours at 85°C, which represents the minimum expected operational life under sustained thermal stress. In practical design scenarios, this specification assumes continuous application of rated voltage and ripple current at the maximum operating temperature. For applications operating below 85°C, the USL1H0R1MDD lifespan extends significantly—the relationship follows an exponential curve where each 10°C reduction approximately doubles the component life. At 65°C, a typical ambient condition, the USL1H0R1MDD can be expected to operate for approximately 4000–8000 hours before capacitance degradation becomes measurable. This 1000-hour rating should not be interpreted as a failure threshold but rather as the point where the USL1H0R1MDD begins to exhibit measurable drift in electrical characteristics.
How does the USL1H0R1MDD compare to solid capacitor alternatives in terms of reliability for industrial applications?
The USL1H0R1MDD, as an aluminum electrolytic capacitor, operates under different failure mechanisms than solid-state capacitors (ceramic or polymer). While the USL1H0R1MDD offers superior volumetric efficiency and lower cost per microfarad, solid capacitors typically demonstrate longer operational life and superior frequency response characteristics. The 1000-hour @ 85°C rating for the USL1H0R1MDD makes it suitable for non-critical buffering and energy storage in industrial designs where component replacement is manageable. Solid alternatives would be necessary only when application lifetime exceeds 10,000 hours continuously at elevated temperature, or when the 1000-hour USL1H0R1MDD rating creates unacceptable maintenance burden.
Can the USL1H0R1MDD safely operate continuously at 50V, or should design margins be applied?
The USL1H0R1MDD is rated for continuous operation at 50V, but practical design practice applies derating to extend component life and provide operational margin. Operating the USL1H0R1MDD at continuous voltage levels above 40V begins to accelerate electrolyte evaporation, directly reducing the 1000-hour @ 85°C specification. For circuits where the USL1H0R1MDD must exceed the 1000-hour design life, voltage should be capped at 80% of rating (40V maximum). At 50V continuous, the USL1H0R1MDD remains stable but should be reserved for applications where the 1000-hour lifetime is acceptable or where operational temperature remains controlled below 65°C.
What ripple current handling differences exist between the 120 Hz and 10 kHz ratings on the USL1H0R1MDD?
The USL1H0R1MDD dissipates ripple current through its equivalent series resistance (ESR), which varies significantly across frequency bands. At 120 Hz (low-frequency ripple), the USL1H0R1MDD handles 1 mA continuously; at 10 kHz, it increases to 1.5 mA, indicating that the USL1H0R1MDD's ESR is higher at low frequencies than at mid-range frequencies. This behavior is typical for aluminum electrolytics and reflects the complex impedance profile of the internal electrode structure. For the USL1H0R1MDD in switching power supply applications (typically 50–200 kHz), the allowable ripple current would exceed the 1.5 mA @ 10 kHz specification—designers must consult ESR curves or contact Nichicon for high-frequency guidance. At power line frequency (50–60 Hz), the USL1H0R1MDD's ripple current tolerance is limited to the 1 mA specification, making it unsuitable as a primary reservoir capacitor without parallel devices.
Is the USL1H0R1MDD suitable for DC-link filtering in motor drive applications?
The USL1H0R1MDD is not recommended as a primary DC-link filter component in motor drive applications. Motor drives impose two competing stresses on the USL1H0R1MDD: elevated ripple current from PWM switching and thermal heating from both ambient conditions and internal dissipation. The USL1H0R1MDD's 1.5 mA ripple current rating at 10 kHz is substantially lower than typical motor drive ripple specifications (50–200 mA in many applications), and the 1000-hour @ 85°C lifetime does not align with the 10+ year availability expectations for motor system components. The 0.1 µF capacitance of the USL1H0R1MDD also provides minimal energy storage for DC-link stability in most motor applications. The USL1H0R1MDD may serve a supplementary role in conjunction with larger, higher-ripple-rated devices, but should never be the primary filter element.
How does the ±20% tolerance of the USL1H0R1MDD affect circuit design for precision timing or filtering applications?
The ±20% tolerance of the USL1H0R1MDD creates significant uncertainty in frequency-dependent applications. In a low-pass filter using the USL1H0R1MDD, the corner frequency can shift by ±20%, or roughly ±1 octave in audio applications. For general-purpose buffering and power supply decoupling, the ±20% tolerance of the USL1H0R1MDD is acceptable because the filter cutoff frequency remains within a functional range; however, for precision timing circuits, the USL1H0R1MDD should be paired with a tighter-tolerance resistor to constrain the RC time constant. If the design requires better than ±10% capacitance accuracy, the USL1H0R1MDD is unsuitable, and a ceramic capacitor with ±5% or ±10% tolerance should be substituted.
What physical space does the USL1H0R1MDD occupy, and how does its footprint compare to surface-mount alternatives?
The USL1H0R1MDD measures 0.157 inches in diameter and 0.315 inches in height (4.0 mm × 8.0 mm), with a lead spacing of 1.50 mm, making it one of the smallest through-hole aluminum electrolytic packages available. On a PCB, the USL1H0R1MDD occupies approximately 0.3 square inches when accounting for solder pad spacing and assembly clearances. Modern surface-mount alternatives (0805 or 1206 ceramic capacitors) would consume similar footprint area but require different assembly equipment. For legacy or hand-assembly boards, the USL1H0R1MDD's radial through-hole design offers faster manual soldering than surface-mount components; for high-volume automated production, a surface-mount equivalent would be preferred. The 1.50 mm lead spacing on the USL1H0R1MDD is compatible with standard 100-mil or 50-mil PCB grid layouts.
What causes capacitance drift in the USL1H0R1MDD over its operational life, and how should this be modeled in long-term reliability analyses?
Capacitance drift in the USL1H0R1MDD results primarily from electrolyte evaporation through the sealed can, which gradually reduces the effective electrode surface area and increases internal resistance. The 1000-hour @ 85°C specification typically represents the point where the USL1H0R1MDD exhibits 15–25% capacitance loss from initial value. Below 85°C, this degradation rate follows an Arrhenius relationship, meaning the USL1H0R1MDD at 65°C will lose similar percentage capacitance over a much longer time span. For reliability modeling, the USL1H0R1MDD should not be treated as a constant-value component beyond 500 hours at peak temperature; instead, capacitance should be assumed to follow a linear decline after the first 100 hours. In filtering applications where the USL1H0R1MDD's initial ±20% tolerance already creates uncertainty, long-term drift can add an additional ±15%, making the cumulative tolerance band unacceptable for precision circuits after several years of operation.
Can the USL1H0R1MDD be reliably operated across its full -40°C to 85°C temperature range without derating?
The USL1H0R1MDD is rated for operation from -40°C to 85°C, but the component exhibits asymmetric performance across this range. At -40°C, the USL1H0R1MDD exhibits reduced capacitance (typically 10–15% below nominal) and significantly elevated ESR due to electrolyte viscosity, making it unsuitable for ripple-current-sensitive applications at cold temperatures. At 85°C, the USL1H0R1MDD's electrolyte becomes more conductive, ESR decreases, but the 1000-hour lifetime constraint applies. For applications requiring reliable operation across the full temperature range, the USL1H0R1MDD should be derated to approximately 80% of nameplate capacitance at -40°C and the ripple current should be reduced by 30–40% at temperatures below 0°C. The USL1H0R1MDD is best suited for designs operating between 0°C and 65°C, where both capacitance and ESR remain relatively stable.
How does the USL1H0R1MDD perform in circuits with DC bias voltage applied continuously without AC ripple?
The USL1H0R1MDD under pure DC bias (no ripple current) experiences slower degradation than under AC ripple stress because internal power dissipation is minimized. However, the 1000-hour @ 85°C rating still applies under continuous DC voltage, as electrolyte evaporation and dielectric stress are voltage and temperature functions, not ripple-current functions. In pure DC applications at 50V and 85°C, the USL1H0R1MDD remains stable and maintains its capacitance value more effectively than under ripple conditions. This makes the USL1H0R1MDD suitable for DC blocking and coupling applications where charge storage is required but ripple filtering is minimal. The primary failure mechanism under DC bias remains evaporation; therefore, reducing operating temperature to 65°C or lower will extend the USL1H0R1MDD's usable life from 1000 hours to several thousand hours even under continuous voltage stress.

Parts with Similar Specifications

The three parts on the right have similar specifications to Nichicon USL1H0R1MDD

Product Attribute USL1H010MDD USL1H100MDD USL1HR33MDD USL1H220MDD
Part Number USL1H010MDD USL1H100MDD USL1HR33MDD USL1H220MDD
Manufacturer Nichicon Nichicon Nichicon Nichicon
Tolerance - - - -
Capacitance - - - -
Surface Mount Land Size - - - -
Ripple Current @ High Frequency - - - -
Height - Seated (Max) - - - -
Applications - - - -
Package - Tape & Reel (TR) Tube Tape & Reel (TR)
Ratings - - - -
Lead Spacing - - - -
ESR (Equivalent Series Resistance) - - - -
Series - - - -
Operating Temperature - -40°C ~ 85°C 0°C ~ 70°C -40°C ~ 85°C
Ripple Current @ Low Frequency - - - -
Mounting Type - Surface Mount Through Hole Surface Mount
Package / Case - 196-LFBGA 16-DIP (0.300', 7.62mm) 64-VFQFN Exposed Pad
Lifetime @ Temp. - - - -
Voltage - Rated - - - -
Polarization - - - -
Size / Dimension - - - -

USL1H0R1MDD Datasheet PDF

Download USL1H0R1MDD pdf datasheets and Nichicon documentation for USL1H0R1MDD - Nichicon.

Datasheets
Aluminum Electrolytic Land, Reflow.pdf Chip Type Tape Spec.pdf
HTML Datasheet
SL Series, U Type.pdf
PCN Obsolescence/ EOL
USL Series 05/Apr/2018.pdf

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Nichicon

USL1H0R1MDD

Nichicon
98D-USL1H0R1MDD

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