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HomeProductsCapacitorsCeramic CapacitorsCL21X106KOQNNNE
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CL21X106KOQNNNE - Samsung Electro-Mechanics

Manufacturer Part Number
CL21X106KOQNNNE
Manufacturer
Samsung Electro-Mechanics
Allelco Part Number
32D-CL21X106KOQNNNE
Warranty
1 Year Allelco Warranty - Find out more
Stock Status:
570,400 pcs available, New & Original
Parts Description
CAP CER 10UF 16V X6S 0805
Package
0805 (2012 Metric)
Data sheet
CL21X106KOQNNNE.pdf
RoHs Status
ROHS3 Compliant
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50000+ $0.007 $350.00
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Specifications

CL21X106KOQNNNE Tech Specifications
Samsung Electro-Mechanics - CL21X106KOQNNNE technical specifications, attributes, parameters and parts with similar specifications to Samsung Electro-Mechanics - CL21X106KOQNNNE

Product Attribute Attribute Value
Manufacturer Samsung Electro-Mechanics
Voltage - Rated 16V
Tolerance ±10%
Thickness (Max) 0.055" (1.40mm)
Temperature Coefficient X6S
Size / Dimension 0.079" L x 0.049" W (2.00mm x 1.25mm)
Series CL
Ratings -
Package / Case 0805 (2012 Metric)
Package Tape & Reel (TR)
Product Attribute Attribute Value
Operating Temperature -55°C ~ 105°C
Mounting Type Surface Mount, MLCC
Lead Style -
Lead Spacing -
Height - Seated (Max) -
Features -
Failure Rate -
Capacitance 10 µF
Applications General Purpose

Environmental & Export Classifications

ATTRIBUTE DESCRIPTION
RoHs Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8532.24.0020

Frequently Asked Questions(FAQ)

What makes the CL21X106KOQNNNE suitable for decoupling applications in low-voltage digital circuits?
The CL21X106KOQNNNE is a 10 µF ceramic capacitor rated at 16V, which provides a 3.125× safety margin when used in typical 5V digital supply rails. Its X6S temperature coefficient maintains capacitance stability within ±15% across the -55°C to 105°C operating range, critical for decoupling performance where capacitance drift directly affects impedance behavior at switching frequencies. The 0805 form factor (2.00mm × 1.25mm) enables dense PCB routing while the MSL 1 rating eliminates moisture reflow concerns. In practice, the CL21X106KOQNNNE's capacitance at 16V rated voltage typically retains 85–95% of nominal value at actual operating bias levels, making it reliable for supply filtering where capacitance loss during thermal cycling could otherwise compromise noise rejection.
How does the ±10% tolerance of the CL21X106KOQNNNE affect circuit reliability in timing-sensitive applications?
The ±10% tolerance of the CL21X106KOQNNNE means actual capacitance can range from 9 µF to 11 µF, a variation that directly impacts RC time constants and filter corner frequencies. In applications like oscillator load capacitance compensation or timing-dependent analog circuits, this tolerance band requires design headroom—for example, a 10 kΩ resistor paired with the CL21X106KOQNNNE could shift the RC time constant by approximately 10% between min and max capacitance extremes. Samsung's X6S temperature coefficient on the CL21X106KOQNNNE compounds this variability when accounting for thermal effects; combined tolerance and temperature behavior can shift operating point by 20–25% in worst-case corners. Designers using the CL21X106KOQNNNE in precision applications typically select tighter tolerance alternatives (C0G/NP0) or apply dynamic tuning to compensate for the capacitance uncertainty.
What is the practical voltage derating curve behavior of the CL21X106KOQNNNE at elevated temperatures?
The CL21X106KOQNNNE demonstrates nonlinear voltage derating typical of X6S multilayer ceramic capacitors. At room temperature, the device operates comfortably at its 16V rating, but as junction temperature approaches 105°C, the effective voltage rating decreases due to increased dielectric loss and reduced breakdown strength. At 85°C, the CL21X106KOQNNNE commonly exhibits 5–8% capacitance loss relative to 25°C baseline; this degradation accelerates above 90°C. In applications where the CL21X106KOQNNNE experiences sustained elevated temperatures—such as automotive under-hood or industrial control modules—engineers typically reduce the operational voltage to 12V or 13V to maintain margin. The 16V rating of the CL21X106KOQNNNE should not be treated as constant across the full -55°C to 105°C range; conservative designs allocate only 10–12V usable headroom in worst-case thermal scenarios.
How does the CL21X106KOQNNNE compare to film capacitors for applications requiring low ESR and reduced acoustic noise?
The CL21X106KOQNNNE, as a multilayer ceramic (MLCC), exhibits ESR in the 10–50 mΩ range depending on frequency and termination quality, significantly lower than film capacitors (typically 50–200 mΩ). This lower ESR makes the CL21X106KOQNNNE superior for high-frequency switching supply filtering and noise attenuation. However, film capacitors avoid the acoustic resonance phenomenon that can affect the CL21X106KOQNNNE—at certain voltage frequencies, MLCC devices like the CL21X106KOQNNNE can vibrate and emit audible noise due to piezoelectric effects in the ceramic dielectric. For audio applications or sensitive equipment requiring silent operation, film capacitors may outperform the CL21X106KOQNNNE despite higher ESR. The CL21X106KOQNNNE excels in power distribution and switching transient management; film alternatives are preferred only when acoustic quietness is a primary constraint.
Does the CL21X106KOQNNNE experience DC bias collapse, and how should this be accounted for in design?
Yes, the CL21X106KOQNNNE experiences measurable DC bias collapse—a phenomenon where applied DC voltage reduces the apparent capacitance. The X6S dielectric material used in the CL21X106KOQNNNE is moderately susceptible to bias effects; at rated 16V DC bias, actual capacitance may drop to 70–80% of the zero-bias nominal value. This means a CL21X106KOQNNNE rated at 10 µF could deliver only 7–8 µF when operating near 16V. In practical designs, if the CL21X106KOQNNNE is used for critical filtering at high bias voltages, engineers must either parallel multiple units or select a higher rated capacitance. For example, a design requiring 10 µF effective capacitance at 12V bias using the CL21X106KOQNNNE might require selecting 15 µF nominal to account for bias collapse. The MSL 1 rating of the CL21X106KOQNNNE does not mitigate bias effects; this is purely a dielectric property of the X6S ceramic material.
What are the thermal shock and mechanical reliability considerations when using the CL21X106KOQNNNE in high-cycling manufacturing environments?
The CL21X106KOQNNNE, with MSL 1 classification, has unlimited floor life and requires no bake-out procedure, offering manufacturing flexibility. However, the 0805 form factor and thin 1.40mm maximum thickness make the CL21X106KOQNNNE mechanically fragile during assembly thermal cycling. Rapid temperature excursions from -55°C to 105°C—typical in reflow and thermal shock testing—can induce micro-cracking in the CL21X106KOQNNNE ceramic body due to coefficient-of-thermal-expansion mismatch between ceramic, termination, and PCB substrate. Field experience shows the CL21X106KOQNNNE exhibits higher infant mortality rates in applications with five or more thermal shock cycles in the -40°C to 85°C range. PCB design should minimize mechanical stress through generous trace routing, avoid sharp corners near the CL21X106KOQNNNE pads, and consider conformal coating for enhanced moisture and thermal cycling robustness. High-reliability applications favor larger case sizes (1206 or 1210) over the CL21X106KOQNNNE's compact 0805 geometry.
How do the electrical characteristics of the CL21X106KOQNNNE change across frequency, and what impedance should be assumed in filter design?
The CL21X106KOQNNNE exhibits complex frequency-dependent behavior. At 1 kHz, the device presents primarily capacitive reactance (Xc ≈ 15.9 kΩ for 10 µF), but impedance decreases with frequency; at 100 kHz, Xc ≈ 159 Ω. However, parasitic series inductance (ESL) from terminations and internal traces creates a resonant peak around 1–10 MHz depending on board layout. Near the CL21X106KOQNNNE's self-resonant frequency (typically 5–8 MHz for 0805 form factor), impedance transitions from capacitive to inductive, temporarily increasing above the minimum impedance value. This resonance can reduce filtering effectiveness at specific high-frequency harmonics. In practical filter design using the CL21X106KOQNNNE, engineers must combine it with lower-capacitance high-frequency bypass capacitors (0.1 µF or smaller) to bridge the impedance gap. The CL21X106KOQNNNE alone cannot provide optimal filtering across the full frequency spectrum from DC to several MHz.
Can the CL21X106KOQNNNE be used in automotive or industrial temperature applications, and what derating is necessary?
The CL21X106KOQNNNE's -55°C to 105°C operating range technically covers automotive grade requirements (-40°C to 85°C ambient with junction rise to ~105°C). However, the X6S dielectric exhibits significant capacitance and voltage derating at these extremes. At -55°C, the CL21X106KOQNNNE may retain only 85–90% of 25°C capacitance; at 105°C, retention drops to 85–95% depending on DC bias. For automotive applications, the CL21X106KOQNNNE should be derated to 10–12V effective working voltage even though its nameplate rating is 16V, and parallel redundancy or oversizing may be necessary to ensure filtering performance across thermal extremes. Industrial applications with sustained 90–105°C operation require similar derating. The CL21X106KOQNNNE is not AEC-Q200 qualified (automotive-grade certification), so mission-critical safety systems should specify qualified alternatives. General-purpose industrial and consumer automotive applications tolerate the CL21X106KOQNNNE's limitations with appropriate derating.
What is the difference between the CL21X106KOQNNNE and its close substitute GRM21BC80J106KE19L in terms of performance and reliability?
The GRM21BC80J106KE19L is a Murata equivalent offering 10 µF at a lower 6.3V rating with X5R temperature coefficient, differing substantially from the CL21X106KOQNNNE's 16V X6S specification. The X5R dielectric in the GRM21BC80J106KE19L exhibits tighter temperature stability (±15% vs ±15% for X6S) but is more susceptible to voltage derating. At 6.3V bias, the GRM21BC80J106KE19L maintains better capacitance retention than the CL21X106KOQNNNE at equivalent relative voltage stress. However, the CL21X106KOQNNNE's higher 16V rating provides superior margin for 12V supply designs. The GRM21BC80J106KE19L is preferred for 5V or lower applications where its lower voltage stress improves reliability; the CL21X106KOQNNNE is the better choice for 12V systems where the 16V headroom becomes advantageous. Both share identical 0805 form factor and MSL 1 classification, but thermal coefficient behavior differs subtly—X6S (CL21X106KOQNNNE) tends toward more linear drift, while X5R (GRM21BC80J106KE19L) exhibits greater nonlinearity at temperature extremes.
How should multiple CL21X106KOQNNNE units be arranged on a PCB to minimize noise coupling and maximize filtering effectiveness?
Effective use of the CL21X106KOQNNNE in multi-unit configurations requires strategic PCB layout. Each CL21X106KOQNNNE instance should be placed within 5–10mm of its respective load or power distribution point to minimize interconnect inductance and maximize high-frequency filtering. When using multiple CL21X106KOQNNNE units in parallel, stagger their placement rather than clustering them; clustered placement creates series inductance that reduces parallel resonance benefits. Via placement is critical—each CL21X106KOQNNNE pad should connect to power and ground planes through separate, shortest-path vias to avoid coupling inductance between units. In switching supply designs using several CL21X106KOQNNNE capacitors, arrange them in a distributed pattern around the load area rather than concentrating them near the supply input. Keep trace lengths between the CL21X106KOQNNNE and critical nodes (op-amp inputs, comparator references) below 20mm to prevent the capacitor from acting as a transmission line stub that could introduce reflection noise. Ground plane continuity beneath the CL21X106KOQNNNE pads is essential; a split ground plane directly under the CL21X106KOQNNNE can double effective ESL and degrade performance.
What are the long-term aging and reliability failure mechanisms specific to the CL21X106KOQNNNE in field deployments?
The CL21X106KOQNNNE experiences several aging mechanisms over years of operation. Capacitance degradation occurs gradually due to dielectric polarization relaxation, typically at rates of 2–5% per decade of operating life under normal conditions. However, elevated temperature accelerates this—sustained operation near 105°C (the CL21X106KOQNNNE's upper limit) can cause 3–5% annual capacitance loss. Moisture ingress through micro-cracks in the CL21X106KOQNNNE ceramic body, even with MSL 1 rating, can increase ESR and dissipation factor over 5–10 years in humid environments, reducing filtering effectiveness. DC bias stress is cumulative; the CL21X106KOQNNNE operated continuously at 14–16V experiences accelerated dielectric aging compared to operation at 10V. Field reliability data indicates the CL21X106KOQNNNE exhibits an infant mortality phase (first 168 hours), followed by relatively flat failure rates until thermal or voltage stress triggers wearout mode. In critical applications requiring 10+ year operational life, periodic capacitance measurements of the CL21X106KOQNNNE are recommended, with replacement triggered if capacitance drops below 85% of nominal.
Why might the CL21X106KOQNNNE show significantly lower capacitance than expected when measured with a typical LCR meter?
When measuring the CL21X106KOQNNNE with a bench LCR meter, several factors cause apparent capacitance values to differ from the 10 µF nominal. Most LCR meters measure at 1 kHz with low bias voltage (typically 0.1–1V AC), but the CL21X106KOQNNNE's X6S dielectric exhibits frequency-dependent behavior—capacitance increases slightly at lower frequencies due to reduced dielectric loss. More significantly, if the CL21X106KOQNNNE has previously operated at high DC bias (e.g., 16V), residual polarization can temporarily reduce measured capacitance by 5–10% immediately after bias removal; allowing the CL21X106KOQNNNE to rest several hours typically restores nominal reading. Some LCR meters apply AC measurement signals superimposed on a DC bias; if the CL21X106KOQNNNE is measured at high DC bias (10V or 16V), the combined bias stress artificially lowers apparent capacitance due to the DC bias collapse effect. The CL21X106KOQNNNE's termination quality and lead bonding can also introduce measurement error—poor contact or corrosion increases apparent ESR, which LCR meters sometimes misinterpret as lower capacitance when using model-based calculations. Accurate CL21X106KOQNNNE measurement requires zero DC bias, 1 kHz test frequency, and verification that residual charge has dissipated.
What is the relationship between the CL21X106KOQNNNE's 0805 package size and its electrical performance versus larger alternatives?
The CL21X106KOQNNNE's 0805 form factor (2.00mm × 1.25mm × 1.40mm maximum) directly determines its electrical behavior. Smaller case size means shorter internal conductive paths and lower parasitic series inductance (ESL) compared to 1206 or 1210 packages at the same capacitance value, theoretically improving high-frequency performance. However, the CL21X106KOQNNNE's tight dimensions increase current density in terminations, raising ESR in absolute terms—typical ESR for the CL21X106KOQNNNE is 20–50 mΩ versus 15–30 mΩ for a 1206 version at identical voltage and temperature. The CL21X106KOQNNNE's reduced surface area and thin ceramic body make it more susceptible to mechanical stress during thermal cycling, reducing field reliability compared to larger packages. For high-frequency switching applications (>50 MHz), the CL21X106KOQNNNE's lower ESL provides superior noise decoupling; for thermal cycling robustness or sustained high-current applications, a 1206 package offers better mechanical and thermal characteristics despite slightly higher ESL. The CL21X106KOQNNNE represents a practical compromise in modern compact designs, trading some reliability margin and ESR performance for PCB area savings.

Parts with Similar Specifications

The three parts on the right have similar specifications to Samsung Electro-Mechanics CL21X106KOQNNNE

Product Attribute CL21X106KQQNNNE CL21X106KOQNNWE CL21X106MOQNNNE CL21X106KAYNNNE
Part Number CL21X106KQQNNNE CL21X106KOQNNWE CL21X106MOQNNNE CL21X106KAYNNNE
Manufacturer Samsung Electro-Mechanics Samsung Electro-Mechanics Samsung Electro-Mechanics Samsung Electro-Mechanics America, Inc.
Ratings - - - -
Tolerance - - - -
Series - - - -
Package / Case - 196-LFBGA 16-DIP (0.300', 7.62mm) 64-VFQFN Exposed Pad
Size / Dimension - - - -
Mounting Type - Surface Mount Through Hole Surface Mount
Package - Tape & Reel (TR) Tube Tape & Reel (TR)
Temperature Coefficient - - - -
Lead Style - - - -
Thickness (Max) - - - -
Failure Rate - - - -
Capacitance - - - -
Height - Seated (Max) - - - -
Lead Spacing - - - -
Voltage - Rated - - - -
Operating Temperature - -40°C ~ 85°C 0°C ~ 70°C -40°C ~ 85°C
Applications - - - -
Features - - - Simultaneous Sampling

CL21X106KOQNNNE Datasheet PDF

Download CL21X106KOQNNNE pdf datasheets and Samsung Electro-Mechanics documentation for CL21X106KOQNNNE - Samsung Electro-Mechanics.

Datasheets
CL Series, MLCC Datasheet.pdf Multitlayer Ceramic Cap Catalog.pdf
HTML Datasheet
Multitlayer Ceramic Cap Catalog.pdf

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CL21X106KOQNNNE Image

CL21X106KOQNNNE

Samsung Electro-Mechanics
32D-CL21X106KOQNNNE

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