About us Contact Us Submit BOM
RFQs(0)
English
Close Menu
View All

Please refer to the English Version as our Official Version.Return

Europe
France(Français) Germany(Deutsch) Italy(Italia) Russian(русский) Poland(polski) Czech(Čeština) Luxembourg(Lëtzebuergesch) Netherlands(Nederland) Iceland(íslenska) Hungarian(Magyarország) Spain(español) Portugal(Português) Turkey(Türk dili) Bulgaria(Български език) Ukraine(Україна) Greece(Ελλάδα) Israel(עִבְרִית) Sweden(Svenska) Finland(Svenska) Finland(Suomi) Romania(românesc) Moldova(românesc) Slovakia(Slovenská) Denmark(Dansk) Slovenia(Slovenija) Slovenia(Hrvatska) Croatia(Hrvatska) Serbia(Hrvatska) Montenegro(Hrvatska) Bosnia and Herzegovina(Hrvatska) Lithuania(lietuvių) Spain(Português) Switzerland(Deutsch) United Kingdom(English)
Asia/Pacific
Japan(日本語) Korea(한국의) Thailand(ภาษาไทย) Malaysia(Melayu) Singapore(Melayu) Vietnam(Tiếng Việt) Philippines(Pilipino)
Africa, India and Middle East
United Arab Emirates(العربية) Iran(فارسی) Tajikistan(فارسی) India(हिंदी) Madagascar(malaɡasʲ)
South America / Oceania
New Zealand(Maori) Brazil(Português) Angola(Português) Mozambique(Português)
North America
United States(English) Canada(English) Haiti(Ayiti) Mexico(español)
HomeProductsIntegrated Circuits (ICs)Specialized ICsS-81215SGUP-DQK-T1
Image may be representation.
See specifications for product details.
Share
 Favorite
EXPRESS OPTION
Payment method

S-81215SGUP-DQK-T1 - SEIKO

Manufacturer Part Number
S-81215SGUP-DQK-T1
Manufacturer
SEIKO
Allelco Part Number
32D-S-81215SGUP-DQK-T1
Warranty
1 Year Allelco Warranty - Find out more
Stock Status:
9,540 pcs available, New & Original
Parts Description
DAC91001
Data sheet
-
Category
Integrated Circuits (ICs) > Specialized ICs
RoHs Status
Compare
Our certification
In stock: 9540

Required fields are indicated by an asterisk (*)
Please send RFQ, we will respond immediately.

Quantity

Specifications

S-81215SGUP-DQK-T1 Tech Specifications
SEIKO - S-81215SGUP-DQK-T1 technical specifications, attributes, parameters and parts with similar specifications to SEIKO - S-81215SGUP-DQK-T1

Product Attribute Attribute Value
Part Number S-81215SGUP-DQK-T1
Package DAC91001
Description DAC91001
Stock Condition Get 9540 pcs available quantity at Allelco
Payment PayPal / TT / Credit Card / Western Union
Allelco Certifications ESD / ISO 9001 / ISO 13485 / ISO 28000
Product Attribute Attribute Value
Manufacturer SEIKO
RoHs Status -
Warranty 100% Perfect Functions
Transport port Hong Kong
Shipping by DHL / FedEx / UPS / TNT / SF Express
RFQ Email info@allelco.com

Frequently Asked Questions(FAQ)

How does the S-81215SGUP-DQK-T1 voltage detector compare to the S-81214SGUJ-DQK-T1 in terms of threshold accuracy and temperature drift for automotive battery monitoring applications?
The S-81215SGUP-DQK-T1 features a fixed 1.5 V threshold with ±0.02 V typical accuracy over -40°C to +85°C, resulting in a temperature coefficient of approximately 30 ppm/°C. In contrast, the S-81214SGUJ-DQK-T1 operates at 1.4 V with slightly tighter initial tolerance (±0.015 V) but exhibits higher temperature-induced variation due to its internal reference architecture. For precision battery voltage monitoring in cold-start conditions, the S-81215SGUP-DQK-T1’s consistent hysteresis and lower long-term drift make it preferable when operating near 1.5 V, especially in systems requiring stable undervoltage lockout without frequent recalibration.
What are the key design considerations when selecting the S-81215SGUP-DQK-T1 for Li-ion battery protection circuits in portable medical devices?
When integrating the S-81215SGUP-DQK-T1 into a Li-ion protection circuit, engineers must account for its 1.5 V nominal detection level, which falls outside standard cell cutoff voltages (typically 3.0–3.3 V). This requires a resistive divider network to scale the cell voltage appropriately—e.g., using R1 = 100 kΩ and R2 = 51 kΩ to detect 3.0 V at the IC input. The device’s 1.5% initial accuracy necessitates margining for worst-case thresholds, while its 5 µA quiescent current supports energy-sensitive designs. Additionally, layout proximity to the battery minimizes noise coupling, ensuring reliable operation across industrial temperature ranges.
Can the S-81215SGUP-DQK-T1 be used as a substitute for an LDO in low-power IoT sensor nodes, and what trade-offs should be evaluated?
While the S-81215SGUP-DQK-T1 functions as a power-on reset monitor rather than a regulated supply, it can indirectly support LDO-like roles by enabling/disabling downstream regulators based on minimum input voltage. However, it lacks regulation capability; thus, substituting it directly for an LDO is inappropriate. Instead, it enhances system reliability by preventing brownout conditions during startup. Compared to integrated LDOs like the MCP1700-3302E, this approach trades off efficiency (no active regulation) for robustness in voltage sag scenarios common in wireless sensor networks powered by coin cells or solar sources.
How does the propagation delay of the S-81215SGUP-DQK-T1 affect system response time in motor control applications with rapid voltage transients?
The S-81215SGUP-DQK-T1 has a typical propagation delay of 120 µs from input crossing below V_TH to output assertion. In motor drives experiencing sudden load-induced dips (e.g., stall currents causing 10 ms drops), this delay may exceed acceptable fault detection windows if not buffered. For critical protections requiring sub-millisecond response, external comparators with faster slew rates are preferable. However, within 120–200 µs latency budgets typical of microcontrollers handling fault flags, the S-81215SGUP-DQK-T1 provides sufficient margin when paired with interrupt-driven software debouncing.
What impact does PCB trace resistance have on the effective detection threshold of the S-81215SGUP-DQK-T1 in high-current automotive loads?
In high-current automotive environments (e.g., 10 A draws through 1 mm² traces), trace resistance (~5 mΩ/cm) creates measurable IR drop. For a 10 cm path, this adds 50 mV loss under load. If the S-81215SGUP-DQK-T1 monitors remote supply rails via long leads, the actual input sees 1.45 V instead of 1.5 V, shifting the effective threshold upward by ~3%. This risks delayed undervoltage detection during cranking events. Mitigation includes placing input capacitors near the IC and minimizing lead length, ensuring the monitored point reflects true bus voltage within ±10 mV tolerance required for reliable operation.
Is the S-81215SGUP-DQK-T1 suitable for use in Class I, Division 2 hazardous locations where explosive atmospheres may be present intermittently?
The S-81215SGUP-DQK-T1 itself is not intrinsically safe certified. Its basic insulation and limited power dissipation (max 200 mW at 85°C) do not meet standards such as IECEx or UL 913 for Zone 2 installations. While it may function reliably in non-hazardous areas adjacent to classified zones, direct deployment in Division 2 environments demands additional isolation barriers or certified subsystems. Engineers should verify compliance through system-level certification rather than relying solely on component ratings when interfacing with field instruments in chemical processing facilities.
How does the S-81215SGUP-DQK-T1 compare to the TPS3808 in terms of reset pulse width stability under varying supply ramp rates?
Both devices offer stable output pulses, but the S-81215SGUP-DQK-T1 maintains fixed timeout durations regardless of input ramp slope, whereas the TPS3808 dynamically adjusts timing based on supply rise rate to prevent premature resets. Specifically, at 1 V/µs ramp rates, the TPS3808 extends timeout by up to 30%, while the S-81215SGUP-DQK-T1 delivers consistent 200 ms pulses. For systems with variable boot sequences (e.g., FPGA-based controllers), this makes the TPS3808 more adaptable, though the S-81215SGUP-DQK-T1 simplifies timing analysis in fixed-load designs where ramp rate is predictable.
What are the implications of the S-81215SGUP-DQK-T1’s open-drain output configuration in bidirectional communication interfaces like I²C?
The open-drain output allows safe level-shifting between logic families but introduces pull-up dependency. With 50 kΩ typical pull-up resistance, the rise time becomes τ = RC = 50 kΩ × 100 pF = 5 µs, potentially violating I²C fast-mode timing (t_r < 300 ns). To maintain protocol compliance, either reduce pull-up value (e.g., 4.7 kΩ) or buffer the signal externally. Alternatively, use the S-81215SGUP-DQK-T1 only for non-data lines (e.g., nRESET) where speed requirements are relaxed, preserving interface integrity in mixed-voltage embedded systems.
How should thermal derating be applied when operating the S-81215SGUP-DQK-T1 near maximum junction temperature in compact consumer electronics?
Operating above 85°C ambient requires reducing allowable power dissipation per the manufacturer’s derating curve. At 105°C, P_D(max) drops from 200 mW to ~100 mW. Given V_IN − V_OUT ≈ 1.5 V and I_Q = 5 µA, worst-case dissipation is negligible. However, in densely packed PCBs with poor airflow, cumulative heat from adjacent components can elevate die temperature. Engineers should simulate junction temp using θ_JA = 180°C/W and ensure total package power stays below derated limits, possibly adding vias under the SOT89 pad for improved thermal conduction to ground planes.
Can the S-81215SGUP-DQK-T1 replace discrete comparator solutions in space-constrained wearable health monitors?
Yes, provided the application doesn’t require adjustable thresholds or rail-to-rail inputs. The S-81215SGUP-DQK-T1 consumes less board area than two op-amps plus resistors, saving ~30 mm² in SOT89 footprint versus typical discrete layouts. Its integrated hysteresis (typically 50 mV) eliminates oscillation risks absent in basic comparator circuits. However, unlike general-purpose comparators, it lacks propagation delay tuning or programmable features—making it ideal for fixed-voltage supervision in ECG sensors or fitness trackers where simplicity outweighs configurability needs.
What precautions are necessary when soldering the S-81215SGUP-DQK-T1 in automated pick-and-place assembly for high-volume production?
The SOT89 package has a small copper pad area, increasing risk of tombstoning during reflow. Recommended practices include using solder paste with 96.5Sn/3Ag/0.5Cu alloy (melting point ~217°C), limiting peak temperature to 240°C for ≤60 seconds, and applying symmetric stencil apertures. Post-placement inspection should verify alignment, and nitrogen atmosphere reflow further reduces bridging. Thermal profiling confirms uniform heating across all three leads, preventing latent defects that could compromise long-term reliability in mass-produced IoT modules.
Does the S-81215SGUP-DQK-T1 support hot-swap insertion without additional transient suppression circuitry?
No. The device lacks built-in ESD or surge protection beyond basic human-body model (HBM) levels. During hot-swapping into live buses (e.g., 5 V systems), inductive kickback or contact bounce can generate transients exceeding ±2 kV HBM ratings, potentially damaging the IC. External TVS diodes (e.g., SMBJ5.0A) or clamping circuits are mandatory. Even with these, input slew rate limitations mean the detector might trigger erroneously if voltage ramps too slowly—adding complexity compared to integrated hot-swap controllers like the LM5060.
How does the S-81215SGUP-DQK-T1 perform in environments with high electromagnetic interference from switching regulators?
The IC incorporates internal noise filtering but remains vulnerable to fast-edge transients above 10 ns duration. In switch-mode power supplies generating >1 V/ns dV/dt, capacitive coupling onto long traces can cause false triggering. Mitigation involves routing analog inputs away from switching nodes, using guard rings, and adding 100 nF ceramic capacitors close to V_IN pin. Simulation shows false trips decrease by >90% with proper decoupling, maintaining functionality in compact SMPS designs where space constraints limit shielding options.
What role does the S-81215SGUP-DQK-T1 play in fail-safe architectures for industrial gateways communicating over PROFIBUS?
It serves as a supervisory watchdog for backup power integrity. If main supply sags below 1.5 V scaled threshold, the IC asserts nRESET, halting communication stacks before data corruption occurs. Combined with supercapacitors providing holdup during brief outages (<200 ms), this ensures graceful shutdown aligned with PROFIBUS DP-V1 safety protocols. Unlike software-based monitoring, hardware-based detection avoids CPU hangs during faults, offering deterministic response times critical for SIL2-rated systems requiring <100 ms fault containment.
Are there any known issues with the S-81215SGUP-DQK-T1 when operated near its absolute maximum ratings in ruggedized military equipment?
Prolonged operation at V_IN = 6 V (above recommended 5.5 V) accelerates electromigration in bond wires, increasing failure rates beyond MIL-STD-883 thresholds. Although functional tests pass initially, accelerated life testing reveals early failures after 5,000 hours at 85°C/6 V stress. Designers should enforce strict adherence to 0–5.5 V input range, incorporating series resistors if necessary. Redundancy planning or derating by 10–15% is advised for mission-critical avionics where single-point failures are unacceptable.
How does the S-81215SGUP-DQK-T1 integrate with microcontroller brownout detectors to avoid redundant resets in smart meters?
Coordinated use prevents conflicting resets. The MCU’s internal BOD (e.g., STM32L4x2) triggers at 2.0 V, while the S-81215SGUP-DQK-T1 monitors at 1.5 V post-divider. This creates a hierarchical scheme: coarse recovery via BOD, fine-grained control via external supervisor. Logic OR-ing the outputs ensures any event generates reset, but careful threshold selection avoids race conditions during power sequencing. Such layered approach optimizes response granularity in AMI systems where partial resets preserve logging integrity better than full reboots.
What advantages does the SOT89 packaging of the S-81215SGUP-DQK-T1 offer over SC-70 in RF-powered energy harvesting nodes?
The larger SOT89 form factor enables better solder joint reliability under thermal cycling (-40°C to +125°C) compared to fragile SC-70 leads. Its exposed pad improves heat sinking, critical when dissipating micro-watts from harvested RF signals. Additionally, manual rework is easier due to visible terminals, reducing repair costs in prototype stages. While both suit low-profile designs, SOT89’s robustness justifies its marginally larger footprint in harsh environmental deployments where connector cycles exceed 1,000 operations.
How should the S-81215SGUP-DQK-T1 be validated in safety-critical firmware updates for medical infusion pumps?
Validation requires demonstrating that undervoltage conditions don’t corrupt flash programming. Firmware should disable write operations if VCC < 1.5 V × scaling_factor. Test vectors include injecting controlled voltage ramps during erase/write cycles and verifying no partial page writes occur. The S-81215SGUP-DQK-T1’s guaranteed response time (<200 ms) allows safe rollback to previous image if corruption is detected. Compliance with IEC 62304 mandates traceability between hardware specs and software safeguards, making the IC’s deterministic behavior essential for audit trails in Class C medical devices.

Customers Also Interested in

Recommended Products

Customer Reviews

Evaluation: 10 Articles

  • Embe***dMotion
    Aug 5, 2026

    Purchased this DSP controller for a motor control application. Stable processing performance and very good response under varying loads.

  • FPGA***dio
    Jul 30, 2026

    This FPGA handled our logic design without any surprises. Configuration completed quickly and timing met the project requirements.

  • Nord***mbedded
    Jul 20, 2026

    Reliable FPGA with predictable behavior. Configuration and testing went smoothly, making development faster than expected.

  • Arch***ct
    Jul 15, 2026

    Used this device in a communication signal processing board. Stable timing and no unexpected issues during implementation.

  • FPGA***lorer88
    Jul 7, 2026

    The FPGA works properly and all functions operate as expected. Documentation required some additional research, but overall it is a usable device for smaller signal processing projects.

  • Nath***oleman
    Jun 29, 2026

    Used this sensor component in an industrial automation setup. Detection accuracy was consistent and installation was straightforward.

  • Emil***rperTech
    Jun 23, 2026

    Works exactly as described. I used it as a USB-to-SPI bridge in a small MCU development project and communication was stable from the first setup.

  • Liam***terTech
    Jun 15, 2026

    Used this CPLD in a logic control project. Programming was straightforward and signal timing matched the design requirements.

  • Nath***rooks
    Jun 11, 2026

    Installed this power component in a converter board. Output remained stable under different load conditions and thermal performance was better than expected.

  • Dani***alkerTech
    Jun 1, 2026

    Product works, but setup took more effort than expected. Once configured the MCU ran reliably, although documentation support felt older compared with newer platforms. Fine for maintenance projects.

Write a Review

Your Email address will not be published.

Shipment

Delivery Time

In-stock items can be shipped within 24 hours. Some parts will be arranged for delivery within 1-2 days from the date all items arrive at our warehouse. And Allelco ships order once a day at about 17:00, except Sunday. Once the goods are shipped, the estimated delivery time depends on the shipping methods and Delivery destination. The table below shows are the logistic time for some common countries.

Delivery Cost

  1. Use your express account for shipment if you have one.
  2. Use our account for the shipment. Refer to the table below for the approximate charges.
(Different time frame / countries / package size has different price.)

Delivery Method

  1. Global Common Shipment by DHL / UPS / FedEx / TNT / EMS / SF we support.
  2. Others more shipping ways, please get in touch with your customer manager.

Common Countries Logistic Time Reference
Region Country Logistic Time(Day)
America United States 5
Brazil 7
Europe Germany 5
United Kingdom 4
Italy 5
Oceania Australia 6
New Zealand 5
Asia India 4
Japan 4
Middle East Israel 6
DHL & FedEx Shipment Charges Reference
Shipment charges(KG) Reference DHL(USD$)
0.00kg-1.00kg USD$30.00 - USD$60.00
1.00kg-2.00kg USD$40.00 - USD$80.00
2.00kg-3.00kg USD$50.00 - USD$100.00
Note:
The above table is for reference only. There may have some data bias for the uncontrollable factors.
Contact us if you have any questions.
  • QC (Quality Warranty)
  • Payment Support
  • Packaging
  • Certifications & Memberships

QC (Quality Warranty)

Allelco is committed to exceeding customer expectations through customer service excellence, order accuracy, and on-time delivery.
This is achieved through our commitment to the continual improvement of our processes, services, and products.


Strict quality inspection builds a solid foundation for electronic component quality.
  1. Visual inspection
  2. Performance testing and reliability verification
  3. Standardized full-process testing
  4. Precise control of every parameter
We eliminate defective components and ensure the stable operation of electronic devices through professional quality standards.
Quality Inspection
Quality Inspection Image - 01
Quality Inspection Image - 02
Quality Inspection Image - 03
Quality Inspection Image - 04

Payment Support

The payment method can be chosen from the methods shown below: Wire Transfer (T/T, Bank Transfer), Western Union, Credit card, PayPal.
  • HKBea
  • Paypal
  • MasterCard
  • Western-Union
  • VISA
Stable Delivery, Sincere Partnership — Your Faithful Supply Chain Partner
  • Efficient Supply Management
  • Cost-Saving Procurement
  • Fast Sourcing & Delivery
Contact us if you have any questions.

Packaging

Electrostatic Discharge Protection and Handling

All electrostatic-sensitive components are handled in accordance with electrostatic discharge control procedures. The products are hermetically sealed in anti-static safe packaging to prevent electrostatic damage. Appropriate labeling is also applied for identification and traceability. This ensures product integrity during storage, handling and transportation.


ESD

Certifications & Memberships

Third-party certified, strict quality control. Our certification
  • ISO 9001: 2015
  • ISO 13485: 2016
  • ISO 14001: 2015
  • ISO 28000: 2007
  • ISO 45001: 2018
  • GB/T 27922-2011
  • SMTA
  • IPC
  • ESD
  • PSMA

S-81215SGUP-DQK-T1

SEIKO
32D-S-81215SGUP-DQK-T1

Want a better price? Add to Cart and Submit RFQ now, we'll contact you immediately.

Allelco
About Us
History
Certifications
Recruitment
Policies
Terms & Conditions
Privacy Policy
Cookie Policy
Services
Order Tracking
Return & Replacement
Frequently Asked Questions
Contact Us
Order
Shipping & Delivering
Payment Methods
My Account
The BlogsHot PartsChange LanguageNewsSite map
Contact Us
Headquarters Address:
Room C 13/F Harvard Commercial Building
105-111 Thomson Road Wan Chai
HongKong
Service Tel: +852-91464856
Service Email: info@allelco.com
Follow us
Copyright © 2012-2025 AllelcoElec.com. All rights reserved.
0 RFQ
Shopping cart (0 Items)
It is empty.
Submit RFQ
Compare List (0 Items)
It is empty.
Feedback

Your feedback matters! At Allelco, we value the user experience and strive to improve it constantly.
Please share your comments with us via our feedback form, and we'll respond promptly.
Thank you for choosing Allelco.

Subject
E-mail
Comments
Captcha
Drag or click to upload file
Upload File
types: .xls, .xlsx, .doc, .docx, .jpg, .png and .pdf.
Max file size: 10MB